发明名称 Method for fabricating a semiconductor structure
摘要 A method for fabricating a semiconductor including defining a first component region and a second component region in a semiconductor body is provided. A first epitaxial layer is formed through the first component region. A second epitaxial layer is formed over the first epitaxial layer, including configuring the physical dimensions of a first active zone of the first component region independent of a second active zone of the second component region via the first epitaxial layer and the second epitaxial layer. In one embodiment, the first component is a radio-frequency transistor and the second component is a varactor.
申请公布号 US7449389(B2) 申请公布日期 2008.11.11
申请号 US20060553704 申请日期 2006.10.27
申请人 INFINEON TECHNOLOGIES AG 发明人 MEISTER THOMAS;SCHAEFER HERBERT;BOECK JOSEF;LACHNER RUDOLF
分类号 H01L21/20 主分类号 H01L21/20
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