发明名称 Reflective projection lens for EUV-photolithography
摘要 A projection lens for imaging a pattern arranged in an object plane onto an image plane using electromagnetic radiation from the extreme-ultraviolet (EUV) spectral region has several imaging mirrors between its object plane and image plane that define an optical axis of the projection lens and have reflective coatings. At least one of those mirrors has a graded reflective coating that has a film-thickness gradient that is rotationally symmetric with respect to a coating axis, where that coating axis is acentrically arranged with respect to the optical axis of the projection lens. Providing at least one acentric, graded, reflective coating allows designing projection lenses that allow highly uniform field illumination, combined with high total transmittance.
申请公布号 US7450301(B2) 申请公布日期 2008.11.11
申请号 US20070723831 申请日期 2007.03.22
申请人 CARL ZEISS SMT AG 发明人 MANN HANS-JUERGEN;ULRICH WILHELM;HUDYMA RUSSEL M.
分类号 G02B17/00;G02B17/06;G02B27/18;G03B27/72;G03F7/20;G21K5/00;H01L21/027 主分类号 G02B17/00
代理机构 代理人
主权项
地址