发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 <p>A method for fabricating a semiconductor device is provided to improve the adhesion property by interposing the tacky film at an interval between the amorphous carbon layer and metal layer. A method for fabricating a semiconductor device includes the step for forming the metal layer(102) on the substrate(101); the step for forming the tacky film(103) on the metal layer; the step for forming the amorphous carbon layer(104) pattern on the tacky film; the step for etching the tacky film to the etching barrier wall the amorphous carbon layer pattern; the step for etching the metal layer to the etching barrier wall the tacky film.</p>
申请公布号 KR20080098244(A) 申请公布日期 2008.11.07
申请号 KR20070043678 申请日期 2007.05.04
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, SANG HOON
分类号 H01L21/027;H01L21/28 主分类号 H01L21/027
代理机构 代理人
主权项
地址