| 摘要 |
A test instrument comprising test modules for supplying a test pattern used for testing a device under test to the device in response to a fed timing signal, a reference clock generating section for generating a reference clock, timing supplying sections provided in correspondence with the test modules and adapted for generating the timing signal according to the reference clock and supplying the timing signal to the corresponding test module, and a control section for controlling the timings at which the timing supplying sections output the timing signals according to the test module delay amounts from the time of when the test modules receive the timing signal until the test modules output the test patterns in such a way that the timings at which the test modules output the test patterns may be approximately the same. |
