LASER ASSISTED MICROWAVE PLASMA SPECTROSCOPY

摘要

The present invention has a laser and a second energy source act in combination to produce a plasma that emits characteristic radiation for a prolonged period of time. The laser energy is directed to a sample for a period of time to ignite a plasma containing the sample material and to either ablate or vaporize the sample. Energy from a second energy source is supplied to the plasma for a second period of time so that the characteristic radiation emitted by the plasma is maintained. The emitted radiation is used to identify chemical elements contained in the sample. The second period of time is typically larger than the first period of time and may be as long as many milliseconds. Supplying energy for this longer period of time allows the plasma to grow in size and contributes to the large enhancement in the detection sensitivity of the present invention.