发明名称 LIQUID FOR LIQUID IMMERSION EXPOSURE AND PATTERN FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To enable the formation of a pattern having a bad profile to be prevented by further enhancing resolution resulting from liquid immersion lithography. <P>SOLUTION: This liquid 203 for liquid immersion exposure located between a resist film 202 formed on a substrate 201 and a projection lens 205 in order to enhance the value of a numerical aperture is produced by adding a carbonyl group or a sulfonyl group containing molecules having a polarity higher than that of water to a solvent. Since this allows refractive index of the liquid 203 to be increased and resolution to be enhanced without imposing any burden on the projection lens 205, a resist pattern having a good profile can be attained. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008270842(A) 申请公布日期 2008.11.06
申请号 JP20080196088 申请日期 2008.07.30
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ENDO MASATAKA;SASAKO MASARU
分类号 H01L21/027;G02B21/00;G03F7/20 主分类号 H01L21/027
代理机构 代理人
主权项
地址