发明名称 |
LIQUID FOR LIQUID IMMERSION EXPOSURE AND PATTERN FORMING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To enable the formation of a pattern having a bad profile to be prevented by further enhancing resolution resulting from liquid immersion lithography. <P>SOLUTION: This liquid 203 for liquid immersion exposure located between a resist film 202 formed on a substrate 201 and a projection lens 205 in order to enhance the value of a numerical aperture is produced by adding a carbonyl group or a sulfonyl group containing molecules having a polarity higher than that of water to a solvent. Since this allows refractive index of the liquid 203 to be increased and resolution to be enhanced without imposing any burden on the projection lens 205, a resist pattern having a good profile can be attained. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2008270842(A) |
申请公布日期 |
2008.11.06 |
申请号 |
JP20080196088 |
申请日期 |
2008.07.30 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
ENDO MASATAKA;SASAKO MASARU |
分类号 |
H01L21/027;G02B21/00;G03F7/20 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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