发明名称 PHASE DIFFERENCE FILM INSPECTING DEVICE, PHASE DIFFERENCE FILM INSPECTING METHOD, AND METHOD OF MANUFACTURING PHASE DIFFERENCE FILM USING SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a phase difference film inspecting device capable of inspecting a defect in phase difference caused by retardation in a thickness direction. <P>SOLUTION: The phase difference film inspecting device has a first linear polarizing plate and a second linear polarizing plate arranged so that absorption axes are orthogonal to each other; phase difference film support parts for supporting a phase difference film to be arranged between the first linear polarizing plate and the second linear polarizing plate; a light source 4 arranged on the first linear polarizing plate side and irradiating the phase difference film supported to the phase difference film support parts, with light through the first linear polarizing plate; and a light receiver arranged on the second linear polarizing plate side and having directivity to receive light transmitted through the second linear polarizing plate. A vertical light receiving angle &theta;<SP>1</SP>of the light receiver is within a range of 0&deg;<&theta;<SP>1</SP><90&deg;, and a parallel light receiving angle &theta;<SP>2</SP>is within a range of 0&deg;<&theta;<SP>2</SP><90&deg;. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008267991(A) 申请公布日期 2008.11.06
申请号 JP20070111603 申请日期 2007.04.20
申请人 DAINIPPON PRINTING CO LTD 发明人 YANAYA TAKESHI;KURODA TSUYOSHI;SHIBATA TAKAYUKI;MARUYAMA HIDEKI
分类号 G01M11/00;G01N21/89;G01N21/892;G02B5/30;G02F1/1335;G02F1/13363 主分类号 G01M11/00
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