发明名称 MULTIPOINT MEASURING METHOD AND SURVEY INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To efficiently and with high accuracy measure multiple points and facilitate the processing and management of data after measurements. SOLUTION: A survey instrument is provided with a telescope part 5, comprising a first imaging part for acquiring wide-angle images and a second imaging part for acquiring telephoto images having higher magnification than that of the wide-angle images; a distance-measuring part for measuring distances by projecting distance-measuring light and receiving reflected light from objects to be measured; an angle-measuring part for detecting the horizontal angle and vertical angle of the telescope part; a drive part for driving the rotation of the telescope part in the horizontal direction and in the vertical direction; and a control unit for controlling imaging of the first imaging part and the second imaging part and controlling the drive part, on the basis of detection results from the angle measuring part. The control unit combines wide-angle images acquired by the first imaging part and composite into a panoramic image; sets measurement planned points by performing edge processings on the wide-angle images; extracts points of measurement, corresponding to the measurement planned points from among the telephoto images, by scanning the measurement-scheduled points and acquiring the telephoto images by the second imaging part on each measurement planned point; and measures the distances to the points of measurements. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008268004(A) 申请公布日期 2008.11.06
申请号 JP20070111896 申请日期 2007.04.20
申请人 TOPCON CORP 发明人 OTOMO FUMIO;OTANI HITOSHI;KANEKO YORIAKI;ANAI TETSUJI;NAGASHIMA TERUKAZU
分类号 G01C15/00;G01C7/00 主分类号 G01C15/00
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