发明名称 SPACER ELECTRODE SMALL PIN PHASE CHANGE MEMORY RAM AND MANUFACTURING METHOD
摘要 A memory device comprising a first pan-shaped electrode having a side wall with a top side, a second pan-shaped electrode having a side wall with a top side and an insulating wall between the first side wall and the second side wall. The insulating wall has a thickness between the first and second side walls near the respective top sides. A bridge of memory material crosses the insulating wall, and defines an inter-electrode path between the first and second electrodes across the insulating wall. An array of such memory cells is provided. The bridges of memory material have sub-lithographic dimensions.
申请公布号 US2008274585(A1) 申请公布日期 2008.11.06
申请号 US20080174496 申请日期 2008.07.16
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LUNG HSIANG LAN;CHEN SHIH HUNG
分类号 H01L45/00 主分类号 H01L45/00
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