发明名称 FACTORY-ALIGNABLE COMPACT CANTILEVER PROBE
摘要 <p>A scanner which includes a gradient index lens for passing and focusing beams from a radiation emitter to a cantilevered member reflective surface of a probe and from the reflective surface to a radiation detector. The lens also serves as a mechanical support for attachment of the radiation emitter and the radiation detector and is also attached to a support for the cantilevered member. The resulting fixed positions of the radiation emitter and the radiation detector relative to the reflective cantilevered member surface allows the scanner to be compact and factory focally alignable.</p>
申请公布号 WO2008133882(A1) 申请公布日期 2008.11.06
申请号 WO2008US05192 申请日期 2008.04.23
申请人 SACHS, FREDERICK 发明人 SACHS, FREDERICK
分类号 G01B5/28;H01J37/26 主分类号 G01B5/28
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