发明名称 ANGULAR-DECOMPOSITION SCATTEROMETER AND INSPECTION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide an angular-decomposition scatterometer that does not indicate measuring errors due to residual defocus or that indicates them only to a smaller extent, and to provide a scatterometer measuring method. <P>SOLUTION: The angular-decomposition scatterometer is provided with an opening plate that includes at least one covered and hidden part that extends into an image on the pupil surface. A defocus value of a target pattern is determined from the radial distance between the innermost point of an image at the covered and hidden part and the nominal center of a pupil image. A plurality of normalization images are captured, by using a reference plate at a plurality of different defocus positions, and proper normalization is subtracted from a measuring spectrum of the target pattern, thereby compensating defocus errors. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008270799(A) 申请公布日期 2008.11.06
申请号 JP20080102614 申请日期 2008.04.10
申请人 ASML NETHERLANDS BV 发明人 DEN BOEF ARIE JEFFREY
分类号 H01L21/66;G03F7/20;H01L21/027 主分类号 H01L21/66
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