发明名称 PLASMA DOPING METHOD AND APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a plasma doping method and apparatus which have excellent reproducibility of the concentration of impurities introduced into the surfaces of samples. <P>SOLUTION: In a vacuum container 1, in a state where gas is ejected toward a substrate 7 placed on a sample electrode 6 through gas ejection holes 5 provided in a counter electrode 3, gas is exhausted from the vacuum container through a turbo molecular pump 8 as an exhaust device, and the inside of the vacuum container 1 is maintained at a predetermined pressure through a pressure adjustment valve 9, the distance between the counter electrode 3 and the sample electrode 6 is set to be sufficiently small with respect to the area of the counter electrode 3 to prevent plasma from being diffused outward, and capacitive-coupled plasma is generated between the counter electrode 3 and the sample electrode 6 to perform plasma doping. The gas used herein is a gas with a low concentration which contains impurities such as diborane or phosphine. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008270833(A) 申请公布日期 2008.11.06
申请号 JP20080153812 申请日期 2008.06.12
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 OKUMURA TOMOHIRO;SASAKI YUICHIRO;OKASHITA KATSUMI;ITO HIROYUKI;MIZUNO BUNJI
分类号 H01L21/265;H05H1/46 主分类号 H01L21/265
代理机构 代理人
主权项
地址