| 摘要 |
An image analysis apparatus (10) including first and second image capture devices( 18) and (20), each image capture device (18) and (20) having a field of view which includes an image detection zone (23); at least one light source (24) adapted to generate a series of parallel lines onto the image detection zone (23); positioning means (14) for locating an object (12) to be analysed in the image detection zone (23); processing means (11) adapted to cause the first and second image capture devices (18) and (20) to capture first and second images of the image detection zone (23), the first and second images comprised of the parallel lines as distorted by the object (12) located in the image detection zone (23), wherein the processing means (11) is further adapted to analyse the lines of the first and second captured images to establish the extent to which each parallel line has been distorted by the object (12), and the processing means (11) further adapted to establish at least one characteristic of the object (11) by analysis of the extent to which the parallel lines have been distorted. |
