发明名称 |
RESISTANCE CHANGE ELEMENT AND SEMICONDUCTOR DEVICE INCLUDING IT |
摘要 |
<p>In order to use a resistance change element having an MIM laminate structure of metal/metal oxide/metal as a switch element, an off resistance larger than that required for a memory element by a factor of 1000 or more must be achieved. If the difference between on resistance and off resistance can be increased when a resistance change element is used as a memory element, high performance such as shorter read-out time can be achieved. A resistance change element which achieves a high off resistance while sustaining a low on resistance is provided. A high off resistance can be achieved while sustaining a low on resistance by adding a second metal performing charge compensation of deficient metal or deficient oxygen not included in the metal oxides of resistance change material.</p> |
申请公布号 |
WO2008132899(A1) |
申请公布日期 |
2008.11.06 |
申请号 |
WO2008JP55236 |
申请日期 |
2008.03.21 |
申请人 |
NEC CORPORATION;ITO, KIMIHIKO;SUNAMURA, HIROSHI;YABE, YUKO |
发明人 |
ITO, KIMIHIKO;SUNAMURA, HIROSHI;YABE, YUKO |
分类号 |
H01L27/10;H01L45/00;H01L49/00 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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