发明名称 Gallium Nitride Substrate and Gallium Nitride Film Deposition Method
摘要 Affords high-carrier-concentration, low-cracking-incidence gallium nitride substrates and methods of forming gallium nitride films. A gallium nitride film 52 in which the carrier concentration is 1x10<SUP>17 </SUP>cm<SUP>-3 </SUP>or more is created. Initially, a gallium nitride layer 51 including an n-type dopant is formed onto a substrate 50. Then, the gallium nitride layer 51 formed on the substrate 50 is heated to form a gallium nitride film 52.
申请公布号 US2008272377(A1) 申请公布日期 2008.11.06
申请号 US20080111971 申请日期 2008.04.30
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 NAKAHATA SEIJI
分类号 H01L29/20;H01L21/205 主分类号 H01L29/20
代理机构 代理人
主权项
地址