发明名称 SEMICONDUCTOR DEVICE, WAFER AND METHOD OF DESIGNING AND MANUFACTURING THE SAME
摘要 A process margin of an interconnect is to be expanded, to minimize the impact of vibration generated during a scanning motion of a scanning type exposure equipment. In a semiconductor device, the interconnect handling a greater amount of data (frequently used interconnect) is disposed in a same orientation such that the longitudinal direction of the interconnects is aligned with a scanning direction of a scanning type exposure equipment, in an interconnect layer that includes a narrowest interconnect or a narrowest spacing between the interconnects. Aligning thus the direction of the vibration with the longitudinal direction of the pattern can minimize the positional deviation due to the vibration.
申请公布号 US2008274586(A1) 申请公布日期 2008.11.06
申请号 US20070951354 申请日期 2007.12.06
申请人 NEC ELECTRONICS CORPORATION 发明人 MATSUBARA YOSHIHISA;KOBAYASHI HIROMASA
分类号 H01L21/00;H01L21/4763 主分类号 H01L21/00
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