TEMPERATURE MEASUREMENT USING CHANGES IN DIELECTRIC CONSTANT AND ASSOCIATED RESONANCE
摘要
A temperature measurement technique for calculating a temperature in a high temperature environment by monitoring a change in resonant frequency of a resonant structure loaded with a dielectric material. A response curve for a reflection coefficient S11 associated with the resonant structure is generated, typically by the use of a network analyzer connected to the resonant structure via a cable. A minimum point for the response curve is identified to detect the resonant frequency for the resonant structure. A calibration map is applied to the minimum point to identify a temperature associated with the resonant frequency of the resonant structure. The temperature associated with the resonant frequency of the resonant structure represents the temperature of the high temperature environment.
申请公布号
WO2007120881(A3)
申请公布日期
2008.11.06
申请号
WO2007US09263
申请日期
2007.04.13
申请人
RADATEC, INC.;BILLINGTON, SCOTT;GEISHEIMER, JONATHAN;HOLST, THOMAS
发明人
BILLINGTON, SCOTT;GEISHEIMER, JONATHAN;HOLST, THOMAS