发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor that is less apt to break, even if stress is applied from the outside, and to provide a method for manufacturing the same. <P>SOLUTION: A semiconductor layer includes a transistor wherein a channel is formed, and has an element layer 120 wherein an insulating layer is formed at the upper portion and lower portion of the transistor and also a plurality of protruding portion s 103, 103a and 103b formed separately from each other at an interval of from 2 &mu;m to 200 &mu;m on the surface layer of the element layer. The longitudinal elasticity module of material that forms the protruding portion s is set to be lower than the longitudinal elasticity modulus of material that forms the insulating layer. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008270784(A) 申请公布日期 2008.11.06
申请号 JP20080076096 申请日期 2008.03.24
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ONUMA HIDETO
分类号 H01L27/12;G06K19/07;G06K19/077;H01L21/02 主分类号 H01L27/12
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