| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for sampling an analog signal, and to provide an analog-to-digital converter (ADC) sampling system where a plurality of analog-to-digital converters are used with a distributed sampling system. SOLUTION: In the system, a plurality of analog-to-digital converters are used in conjunction with the distributed sampling system. According to the combination of the plurality of converters and the distributed sampling system, conventional device processing such as processing of 0.18-micron silicon, etc., can be used, and moreover, an input signal of a very high frequency is accurately sampled. The distributed sampling system enables a plurality of samplings for an input signal using a different ADC for each sampling. Each sampling is continuously shifted from the last preceding sampling by only a specific amount of time duration. Sampling data from a number of ADCs is combined to form a single continuous digital output signal. As for a type of the distributed sampling system, a plurality of long wiring patterns connected in series, a specific dielectric constant material device, and a sequencer or a multiplier can be employed. COPYRIGHT: (C)2009,JPO&INPIT
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