| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit permitting the entire circuit to normally operate by relieving a defect of one part of a circuit if it occurs, reducing a change in signal delay due to the relief of the defect and realizing an optimum architecture in a structured ASIC. SOLUTION: In cell units 201(-1 to -5) and a redundant cell unit 202, combination circuit portions 210C, 210R are integrally formed in a first area AR1 of a circuit array, and order circuit portions 220C, 220R are formed in a second area AR2 adjacent to the first area AR1 where the combination circuit portions 210C, 210R are disposed (adjacent to the upper side in a figure in this embodiment). COPYRIGHT: (C)2009,JPO&INPIT
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