发明名称 POLISHING DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD USING THIS, AND SEMICONDUCTOR DEVICE MANUFACTURED BY THIS METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing device improved in through-put. <P>SOLUTION: This polishing device 1 is configured to set a gain value and a dress time of a polishing pad 13 in a dress position control of a dresser 30 according to a dress rate by a polishing control section 60 in an adjust process before start of a series of polishing processes for polishing a plurality of semiconductor wafers W successively by a polishing tool 10. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008264944(A) 申请公布日期 2008.11.06
申请号 JP20070112190 申请日期 2007.04.20
申请人 NIKON CORP 发明人 TANAKA TOSHIHISA;TANAKA JUNJI
分类号 B24B37/00;B24B53/00;B24B53/017;B24B53/02;H01L21/304 主分类号 B24B37/00
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