发明名称 |
POLISHING DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD USING THIS, AND SEMICONDUCTOR DEVICE MANUFACTURED BY THIS METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a polishing device improved in through-put. <P>SOLUTION: This polishing device 1 is configured to set a gain value and a dress time of a polishing pad 13 in a dress position control of a dresser 30 according to a dress rate by a polishing control section 60 in an adjust process before start of a series of polishing processes for polishing a plurality of semiconductor wafers W successively by a polishing tool 10. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2008264944(A) |
申请公布日期 |
2008.11.06 |
申请号 |
JP20070112190 |
申请日期 |
2007.04.20 |
申请人 |
NIKON CORP |
发明人 |
TANAKA TOSHIHISA;TANAKA JUNJI |
分类号 |
B24B37/00;B24B53/00;B24B53/017;B24B53/02;H01L21/304 |
主分类号 |
B24B37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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