发明名称 |
SPEEDING UP DEFECT DIAGNOSIS TECHNIQUES |
摘要 |
<p>Fault diagnosis techniques (e.g., effect-cause diagnosis techniques) can be speeded up by, for example, using a relatively small dictionary. Examples describe herein exhibit a speed up of effect-cause diagnosis by up to about 160 times. The technologies can be used to diagnose defects using compacted fail data produced by test response compactors. A dictionary of small size can be used to reduce the size of a fault candidate list and also to facilitate procedures to select a subset of passing patterns for simulation. Critical path tracing can be used to handle failing patterns with a larger number of failing bits, and a pre-computed small dictionary can be used to quickly find the initial candidates for failing patterns with a smaller number of failing bits. Also described herein are exemplary techniques for selecting passin patterns for fault simulation to identify faults in an electronic circuit.</p> |
申请公布号 |
WO2007109322(A3) |
申请公布日期 |
2008.11.06 |
申请号 |
WO2007US07021 |
申请日期 |
2007.03.20 |
申请人 |
MENTOR GRAPHICS CORPORATION;ZOU, WEI;TANG, HUAXING;CHENG, WU-TUNG |
发明人 |
ZOU, WEI;TANG, HUAXING;CHENG, WU-TUNG |
分类号 |
G01R31/28;G06F11/00 |
主分类号 |
G01R31/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|