发明名称 ELECTRONIC DEVICE TESTING BOX
摘要 PROBLEM TO BE SOLVED: To provide an electronic device testing box having high visibility which can carry out visual inspection of an electronic device inside a test box body, when a thick ITO film is formed on a glass plate, or when the ITO film is formed on both sides of the glass plate. SOLUTION: The electronic device test box 1 comprises the test box body 10 which has a radio wave shielding property from outside, while the electronic device P is placed in the inside; a window 20, on which the glass plate 21 having the radio wave shielding properties and transparent to a visible light is mounted; and the window 20 which is formed on a door 12, consisting a part of the test box body 10. Moreover, the test box body 10 includes a radio wave absorbing body 30, mounted on the inner surface of the test box body and a bright color insulating layer (plastic film 40), fixed to the surface of the radio wave absorbing body 30. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008268173(A) 申请公布日期 2008.11.06
申请号 JP20070266547 申请日期 2007.10.12
申请人 NIPPON LIGHT METAL CO LTD 发明人 NAGASHIMA MICHIO;UCHIDA KATSUYA;YAMAMOTO KATSUSHI
分类号 G01R31/00;G01R29/10;H05K9/00 主分类号 G01R31/00
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