摘要 |
PROBLEM TO BE SOLVED: To markedly improve inspection accuracy, in inspection of a fluorescent coating film of a fluorescent lamp. SOLUTION: This fluorescent lamp inspecting device 1 comprises a surface-emitting light source 2, a camera 3 and an image processor 4. The image processor 4 comprises an image memory 5 and an arithmetic unit 6. The arithmetic unit 6 has a determining means 17. The fluorescent lamp 11 irradiated with the light from the surface-emitting light source 2 is imaged by the camera 3 provided on the opposite side to the surface-emitting light source 2, and image data is stored in an image memory 5. The determining means 17 carries out chip failure inspection processing and film thickness failure inspection processing on the stored image data. In both inspection processing, abnormal parts of the chip failure and film thickness failure can be distinguished clearly as bright parts, while a normal part is set as a dark part. As a result, inspection accuracy can be improved markedly, in comparison with conventional technologies which are influenced by reflected light from the surface of a glass tube 11. COPYRIGHT: (C)2009,JPO&INPIT
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