| 摘要 |
The present invention provides a time-of-flight (TOF) mass analyzer. The system includes an analyzer vacuum housing isolated from the evacuated ion source vacuum housing by a gate valve maintained at ground potential. A pulsed ion source is located within the ion source housing, and the gate valve is located in a first field-free region at ground potential. A second field-free drift space within the analyzer housing is biased at high voltage with opposite polarity to the voltage applied to the pulsed ion source. Novel ion detectors are provided with input surfaces in electrical contact with the second field-free drift space with output connected to an external digitizer at ground potential.
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