发明名称 DOUBLE GATE JFET WITH REDUCED AREA CONSUMPTION AND FABRICATION METHOD THEREFOR
摘要 Double gate JFET with reduced area consumption and fabrication method therefore. Double-gate semiconductor device including a substrate having a shallow trench isolator region comprising a first STI and a second STI, a channel region having a first and second channel edges, the channel region formed in the substrate and disposed between and in contact with the first STI and the second STI at the first and second channel edge. The first STI has a first cavity at the first channel edge, and the second STI has a second cavity at the second channel edge. The device further includes a gate electrode region comprising conductive material filling at least one of the first and second cavities. At least one of the first and second cavities is physically configured to provide electrical coupling of the gate electrode region to a back-gate P-N junction.
申请公布号 US2008272406(A1) 申请公布日期 2008.11.06
申请号 US20080113118 申请日期 2008.04.30
申请人 DSM SOLUTIONS, INC. 发明人 BANNA SRINIVASA R.
分类号 H01L29/808;H01L21/337 主分类号 H01L29/808
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