发明名称 METHOD OF FORMING GATE OF SEMICONDUCTOR DEVICE
摘要 <p>The property of transistor can be improved by solving he problem generated in case of using the dual polysilicon gate. The light oxidation process is performed on the laminate pattern and pad nitride layer to form the light oxidation film. The light oxidation film is etched by anisotropic etching and the light oxide layer space(16a) is formed on the side wall of the laminate pattern of the metal layer pattern(20a) and hard mask film pattern(22a). The pad nitride layer is removed by using the phosphoric acid. A transistor is formed by performing the post process such as the landing plug contact formation process.</p>
申请公布号 KR100866719(B1) 申请公布日期 2008.11.05
申请号 KR20070065130 申请日期 2007.06.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JIN, AE KYUNG
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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