发明名称 Selective program voltage ramp rates in non-volatile memory
摘要 A non-volatile memory system is programmed so as to reduce or avoid program disturb. In accordance with one embodiment, multiple program inhibit schemes are employed for a single non-volatile memory system. Program inhibit schemes are selected based on the word line being programmed. Certain program inhibit schemes have been discovered to better minimize or eliminate program disturb at select word lines. In one embodiment, selecting a program inhibit scheme includes selecting a program voltage pulse ramp rate. Different ramp rates have been discovered to better minimize program disturb when applied to select word lines. In another embodiment, the temperature of a memory system is detected before or during a program operation. A program inhibit scheme can be selected based on the temperature of the system.
申请公布号 US7447086(B2) 申请公布日期 2008.11.04
申请号 US20070866261 申请日期 2007.10.02
申请人 SANDISK CORPORATION 发明人 WAN JUN;LUTZE JEFFREY;HIGASHITANI MASAAKI;HEMINK GERRIT JAN;OOWADA KEN;CHEN JIAN;GONGWER GEOFFREY S
分类号 G11C7/00 主分类号 G11C7/00
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