发明名称 Scanning electron microscope
摘要 It is facilitated in a scanning electron microscope to save the labor of executing the reproduction test, conduct basic analysis on a problem caused in execution of the automatic observation process, and confirm details resulting in the error. Upon detecting an error from an abnormality, the scanning electron microscope extracts a sample image Im(t 2 ) obtained by retroceding from a sample image Im(te) stored so as to be associated with time te of error occurrence by a predetermined video quantity (for example, total recording time period t 2 ) previously set and registered by an input-output device, from sample images stored in a recording device while being overwritten, and stores a resultant sample image in another recording device.
申请公布号 US7446313(B2) 申请公布日期 2008.11.04
申请号 US20060357020 申请日期 2006.02.21
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 MAEDA TATSUYA
分类号 H01J37/28 主分类号 H01J37/28
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