发明名称 Capacitor including a percentage of amorphous dielectric material and a percentage of crystalline dielectric material
摘要 The invention comprises integrated circuitry and to methods of forming capacitors. In one implementation, integrated circuitry includes a capacitor having a first capacitor electrode, a second capacitor electrode and a high K capacitor dielectric region received therebetween. The high K capacitor dielectric region has a high K substantially amorphous material layer and a high K substantially crystalline material layer. In one implementation, a capacitor forming method includes forming a first capacitor electrode layer over a substrate. A substantially amorphous first high K capacitor dielectric material layer is deposited over the first capacitor electrode layer. The substantially amorphous high K first capacitor dielectric material layer is converted to be substantially crystalline. After the converting, a substantially amorphous second high K capacitor dielectric material layer is deposited over the substantially crystalline first high K capacitor dielectric material layer. A second capacitor electrode layer is formed over the substantially amorphous second high K capacitor dielectric material layer.
申请公布号 US7446363(B2) 申请公布日期 2008.11.04
申请号 US20060361111 申请日期 2006.02.24
申请人 MICRON TECHNOLOGY, INC. 发明人 AGARWAL VISHNU K.
分类号 H01L27/108;H01L21/02;H01L21/314;H01L21/316;H01L21/8242;H01L29/92 主分类号 H01L27/108
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