发明名称 SUBSTRATE PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To make a film thickness uniform when a thin film is formed. SOLUTION: There are provided a reaction chamber 6 for accommodating a plurality of substrates 7 stacked in multiple stages in a horizontal direction; a rotation mechanism 20 for rotating the substrates; gas supply members 51, 52 including a gas nozzle 42 extending in a stacking direction of the substrates, for alternately repeatedly supplying first and second processing gas (NH<SB>3</SB>and DCS) from peripheral edge portions of the substrates 7 to the substrates 7; and a gas exhaust member 40 for exhausting inside of the reaction chamber, wherein a supply timing of the processing gas and a rotation speed of the rotation mechanism 20 are controlled, so that a peripheral edge place of the substrates 7 at the time of previously supplying the first processing gas (DCS) to the substrates 7, and a peripheral edge place of the substrates 7 at the time of supplying the first processing gas subsequently, are set as different places. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008263224(A) 申请公布日期 2008.10.30
申请号 JP20080176472 申请日期 2008.07.07
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 SAKAI MASANORI;KAGAYA TORU;SHIMA NOBUHITO
分类号 H01L21/31;C23C16/455 主分类号 H01L21/31
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