发明名称 SCANNING ELECTRON MICROSCOPE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a scanning electron microscope device in which an electron gun is maintained in vacuum. SOLUTION: The scanning electron microscope 1 is provided with an electron gun 2 in which a metal film, a carbon film, a diamond film, and a diamond-like carbon film which transmit accelerating electrons and can endure the atmosphere are provided at the electron gun window 35, and a sealed container 33 is maintained in vacuum. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008262886(A) 申请公布日期 2008.10.30
申请号 JP20070129844 申请日期 2007.04.12
申请人 BEAM SEIKO:KK 发明人 ETO KIICHI;TAKESHIMA MASAMICHI;MIYAKE TSUNENOBU
分类号 H01J37/18;H01J37/28 主分类号 H01J37/18
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