发明名称 |
SEMICONDUCTOR CHIP PACKAGE AND METHOD OF FABRICATING THE SAME |
摘要 |
A semiconductor chip package capable of improving reliability at a chip interconnection portion and improving reliability in a solder joint by reducing thermal and mechanical stresses at an external portion of the package including a solder ball land, and a method of fabricating the package are provided. The method of fabricating a semiconductor chip package includes providing a substrate; forming a first underfill on a first portion of the substrate; forming a second underfill at a chip interconnection portion of the substrate; and mounting a semiconductor chip on the chip interconnection portion using conductive bumps. In the method, the second underfill is formed of a material having a modulus higher than the first underfill.
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申请公布号 |
US2008268579(A1) |
申请公布日期 |
2008.10.30 |
申请号 |
US20080110215 |
申请日期 |
2008.04.25 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
YU HAE-JUNG;SHIN MU-SEOB;HWANG TAE-JOO;CHUNG TAE-GYEONG;AHN EUN-CHUL |
分类号 |
H01L21/56 |
主分类号 |
H01L21/56 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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