发明名称 SEMICONDUCTOR CHIP PACKAGE AND METHOD OF FABRICATING THE SAME
摘要 A semiconductor chip package capable of improving reliability at a chip interconnection portion and improving reliability in a solder joint by reducing thermal and mechanical stresses at an external portion of the package including a solder ball land, and a method of fabricating the package are provided. The method of fabricating a semiconductor chip package includes providing a substrate; forming a first underfill on a first portion of the substrate; forming a second underfill at a chip interconnection portion of the substrate; and mounting a semiconductor chip on the chip interconnection portion using conductive bumps. In the method, the second underfill is formed of a material having a modulus higher than the first underfill.
申请公布号 US2008268579(A1) 申请公布日期 2008.10.30
申请号 US20080110215 申请日期 2008.04.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YU HAE-JUNG;SHIN MU-SEOB;HWANG TAE-JOO;CHUNG TAE-GYEONG;AHN EUN-CHUL
分类号 H01L21/56 主分类号 H01L21/56
代理机构 代理人
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