发明名称 SELF-VALIDATED MEASUREMENT SYSTEMS
摘要 Sensor data may be received from multiple sensors configured to sense properties of a process control system. The sensor data may include sensed values and uncertainty data corresponding to the sensed values. A new measurement associated with the process control system and corresponding uncertainty data for the new measurement may be determined based on the sensed values and uncertainty data received from the multiple sensors.
申请公布号 US2008270162(A1) 申请公布日期 2008.10.30
申请号 US20070862114 申请日期 2007.09.26
申请人 INVENSYS SYSTEMS, INC. 发明人 MACHACEK MILOS JAROSLAV
分类号 G06Q10/00;G06F17/00 主分类号 G06Q10/00
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