NONVOLATILE SEMICONDUCTOR MEMORY DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory device for setting an efficient writing voltage.

SOLUTION: A test circuit relating to a write test sequence is equipped with: a first counter for counting the number of loops for each page writing; a second counter for counting the number of accumulated loops required for the selected all pages writing; a divider for obtaining the average number of loops by dividing the number of accumulated loops by the number of selected all pages; an adder for obtaining a difference amount between the average number of loops and its expected value; and a decision circuit for deciding a suitability or otherwise, of initialized value of writing voltage which is set based on the difference amount.

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