发明名称 Method of Forming a Fully Silicided Semiconductor Device with Independent Gate and Source/Drain Doping and Related Device
摘要 A method of forming a fully silicided semiconductor device with independent gate and source/drain doping and related device. At least some of the illustrative embodiments are methods comprising forming a gate stack over a substrate (the gate stack comprising a polysilicon layer and a blocking layer), and performing an ion implantation into an active region of the substrate adjacent to the gate stack (the blocking layer substantially blocks the ion implantation from the polysilicon layer).
申请公布号 US2008265345(A1) 申请公布日期 2008.10.30
申请号 US20080135910 申请日期 2008.06.09
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 YU SHAOFENG;MEHRAD FREIDOON;LU JIONG-PING
分类号 H01L49/00 主分类号 H01L49/00
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