发明名称 SILICON GERMANIUM HETEROJUNCTION BIPOLAR TRANSISTOR STRUCTURE AND METHOD
摘要 Disclosed is an improved semiconductor structure (e.g., a silicon germanium (SiGe) hetero-junction bipolar transistor) having a narrow essentially interstitial-free SIC pedestal with minimal overlap of the extrinsic base. Also, disclosed is a method of forming the transistor which uses laser annealing, as opposed to rapid thermal annealing, of the SIC pedestal to produce both a narrow SIC pedestal and an essentially interstitial-free collector. Thus, the resulting SiGe HBT transistor can be produced with narrower base and collector space-charge regions than can be achieved with conventional technology.
申请公布号 US2008265282(A1) 申请公布日期 2008.10.30
申请号 US20070741836 申请日期 2007.04.30
申请人 GLUSCHENKOV OLEG;KRISHNASAMY RAJENDRAN;SCHONENBERG KATHRYN T 发明人 GLUSCHENKOV OLEG;KRISHNASAMY RAJENDRAN;SCHONENBERG KATHRYN T.
分类号 H01L31/11;H01L21/331;H01L31/00;H01L31/117 主分类号 H01L31/11
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