发明名称 METHODS FOR FABRICATING A CAPACITOR
摘要 A method for forming a capacitor comprises providing a substrate. A bottom electrode material layer is formed on the substrate. A first mask layer is formed on the bottom electrode material layer. A second mask layer is formed on the first mask layer. The second mask layer is patterned to form a patterned second mask layer in a predetermined region for formation of a capacitor. A plurality of hemispherical grain structures are formed on a sidewall of the patterned second mask layer. The first mask layer is etched by using the hemispherical grain structures and the patterned second mask layer as a mask, thereby forming a patterned first mask layer having a pattern. The pattern of the first mask layer is transferred to the bottom electrode material layer. And, a capacitor dielectric layer and a top electrode layer are formed on the bottom electrode material layer to form the capacitor.
申请公布号 US2008268593(A1) 申请公布日期 2008.10.30
申请号 US20080168016 申请日期 2008.07.03
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 LEE HENGYUAN;LEE LURNG-SHEHNG;WANG CHING CHIUN;TZENG PEI-JER
分类号 H01L21/8242 主分类号 H01L21/8242
代理机构 代理人
主权项
地址