发明名称 Semiconductor Device and Manufacturing Method Thereof
摘要 An object is to provide a semiconductor device in which, through a simpler process, junction capacitance and power consumption can be reduced more than a conventional semiconductor device, and a manufacturing method thereof. An insulating film including an opening is formed over a base substrate and a part of a bond substrate is transferred to the base substrate, with the insulating film interposed therebetween, whereby a semiconductor film including a cavity between the semiconductor film and the base substrate is formed over the base substrate. Then, a semiconductor device including a semiconductor element such as a transistor is manufactured using the semiconductor film. The transistor includes a cavity between the base substrate and the semiconductor film used as an active layer. One cavity may be provided or a plurality of cavities may be provided.
申请公布号 US2008265323(A1) 申请公布日期 2008.10.30
申请号 US20080053745 申请日期 2008.03.24
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 MIYAIRI HIDEKAZU
分类号 H01L29/786;H01L21/30 主分类号 H01L29/786
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