Measuring device for vectorial measurement of transmission or reflection of components of electro-technology, has N gates with device for measurement of amplitude of incident, reflected or transmitted wave to N gates of measuring object

摘要

The measuring device comprises N gates with a device for measurement of an amplitude (1) of an incident, a reflected or a transmitted wave to the N gates of a measuring object (2). A signal overlapping device (3) is provided for a phase measurement by overlapping of measuring and reference signal. A generator has a reference frequency source (6), whose signal is supplied to a local microwave synthesizer (7) and two direct digital synthesizers (8).