发明名称 |
DRAM DEVICE HAVING BURRIED CONATCT PLUG AND THE METHOD OF FORMING THE SAME |
摘要 |
A DRAM device and a method for forming the same are provided to secure the etching process margin while forming a buried contact hall by preventing the electric connection between a buried contact plug and a bit line. A DRAM device comprises a first and second active regions(120a,120b) on a semiconductor substrate; a pair of gate patterns(122a,122b) passing over the first and second active regions; a first interlayer dielectric layer covering the whole surface of semiconductor substrate; a pair of bit line formed on the first interlayer dielectric layer and crossing the pair of gate patterns; a second interlayer dielectric layer covering the both substrates of bit lines; a first and second buried contact hall plugs(152a,152b) arranged in a buried contact hall which passes through the first and second interlayer dielectric layers.
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申请公布号 |
KR20080096066(A) |
申请公布日期 |
2008.10.30 |
申请号 |
KR20070040975 |
申请日期 |
2007.04.26 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, YUN GI |
分类号 |
H01L27/108;H01L21/28;H01L21/8242 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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