发明名称 DRAM DEVICE HAVING BURRIED CONATCT PLUG AND THE METHOD OF FORMING THE SAME
摘要 A DRAM device and a method for forming the same are provided to secure the etching process margin while forming a buried contact hall by preventing the electric connection between a buried contact plug and a bit line. A DRAM device comprises a first and second active regions(120a,120b) on a semiconductor substrate; a pair of gate patterns(122a,122b) passing over the first and second active regions; a first interlayer dielectric layer covering the whole surface of semiconductor substrate; a pair of bit line formed on the first interlayer dielectric layer and crossing the pair of gate patterns; a second interlayer dielectric layer covering the both substrates of bit lines; a first and second buried contact hall plugs(152a,152b) arranged in a buried contact hall which passes through the first and second interlayer dielectric layers.
申请公布号 KR20080096066(A) 申请公布日期 2008.10.30
申请号 KR20070040975 申请日期 2007.04.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YUN GI
分类号 H01L27/108;H01L21/28;H01L21/8242 主分类号 H01L27/108
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