发明名称 GAS SUPPLY SYSTEM OF SEMICONDUCTOR MANUFACTURING APPARATUS
摘要 <p><P>PROBLEM TO BE SOLVED: To prevent mixing of volatile metal component that cannot be removed by a gas filter when a corrosive gas is supplied to a semiconductor manufacturing apparatus. <P>SOLUTION: The gas supply system can be supply a highly corrosive gas to a semiconductor manufacturing apparatus (for example, heat treatment apparatus 110) through a gas supply passage 220, and it is provided with a gas filter 240 provided to the gas supply passage 220 and a metal component removal device 250 that is installed on the downstream of the installation position of the gas filter 240 of the gas supply passage 220 so as to liquefy and remove volatile metal component included in a gas passing the gas supply passage 220. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2008262965(A) 申请公布日期 2008.10.30
申请号 JP20070102556 申请日期 2007.04.10
申请人 TOKYO ELECTRON LTD 发明人 MORIYA SHUJI;NAKAO MASARU
分类号 H01L21/31;B01D8/00;H01L21/22 主分类号 H01L21/31
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