| 摘要 |
PROBLEM TO BE SOLVED: To achieve the combination of independent optimum input and output bus width by equipping with a data transmission controller for effecting equivalent transmission capacity conversion between parallel-serial to permit customization by making a parallel bus width and a serial lane independent. SOLUTION: The semiconductor inspection device is provided with a data transmission device comprising: an equivalent transmission capacity conversion, having a buffer memory adjusted so that whose width coincides with the larger side of either a parallel width or the width of serial lane number, a prestage bus switching unit for filling input data into the buffer memory without remaining vacant space, and a poststage bus switching unit for filling read-out data into the width of serial lane of arbitrary number without remaining vacant space; and an equivalent transmission capacity reverse conversion having the prestage bus switching unit for filling input data into the buffer memory without remaining vacant space and a postbus switching unit for filling data read out of the buffer memory into the parallel bus having an arbitrary width without remaining vacant space. COPYRIGHT: (C)2009,JPO&INPIT
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