发明名称 DEPOSITION ANALYSIS FOR ROBOT MOTION CORRECTION
摘要 A center (410) of the deposited material (324) may be offset from a center (400) of the substrate (322). Measuring the offset between the centers (400, 410), may be utilized to correct the position of the substrate (322) on the pedestal (300) so that the deposited material (342) is concentrically deposited on the substrate (322).
申请公布号 WO2008052102(A3) 申请公布日期 2008.10.30
申请号 WO2007US82498 申请日期 2007.10.25
申请人 APPLIED MATERIALS, INC.;MARTIN, TODD, W.;SANSONI, STEVEN, V.;RICE, MICHAEL, R.;NG, ERIC;HUDGENS, JEFFREY, C.;GUCKEL, FREDERICK;KAPLAN, RUSSELL 发明人 MARTIN, TODD, W.;SANSONI, STEVEN, V.;RICE, MICHAEL, R.;NG, ERIC;HUDGENS, JEFFREY, C.;GUCKEL, FREDERICK;KAPLAN, RUSSELL
分类号 G06F19/00 主分类号 G06F19/00
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