发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME |
摘要 |
<p>A semiconductor device and a method for fabricating the same are provided to improve the carrier mobility of NMOS transistor AND PMOS transistor without adding an additional process for the first and second regions. A method for fabricating a semiconductor device includes the step of providing a semiconductor substrate(100) having a first and second regions; the step of forming a first gate electrode(121a) on the first region, a second gate electrode(122a) on the second region; the step of forming a first source/drain region in the semiconductor substrate by injecting a first conductive foreign materials with a first tilt angle to the first region; the step of forming a second source/drain region in the semiconductor substrate by injecting a second conductive foreign materials with a second tilt angle greater than the first tilt angle to the second region; the step of forming a capping layer on a front side of semiconductor substrate; and the step of annealing the outcome.</p> |
申请公布号 |
KR20080096076(A) |
申请公布日期 |
2008.10.30 |
申请号 |
KR20070041005 |
申请日期 |
2007.04.26 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SHIN, DONG SUK;JEONG, YONG KUK |
分类号 |
H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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