发明名称 REFERENCE CELL LAYOUT WITH ENHANCED RTN IMMUNITY
摘要 A reference cell layout includes a plurality of active areas, in parallel to each other, and a first contact of the active areas, and a first gate, the first contact shorting the active areas. A memory device includes the reference cell layout and a corresponding array of memory cells having active areas sized substantially identical to the active areas of the reference cell layout and plural second contacts respectively contacting the active areas of the memory cells.
申请公布号 US2008266929(A1) 申请公布日期 2008.10.30
申请号 US20070741462 申请日期 2007.04.27
申请人 STMICROELECTRONICS S.R.L. 发明人 GHILARDI TECLA;TESSARIOL PAOLO;SERVALLI GIORGIO;GROSSI ALESSANDRO;VISCONTI ANGELO;CAMERLENGHI EMILIO
分类号 G11C11/00 主分类号 G11C11/00
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