发明名称 |
Flexible redundancy replacement scheme for semiconductor device |
摘要 |
A redundancy replacement scheme for repairing a faulty memory cell including memory cells arranged in memory blocks containing word lines and column select lines. The redundancy replacement scheme including replacing the faulty memory cell in a second memory block with a spare memory cell in the second memory block based on a decoded address of a first memory block.
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申请公布号 |
US2008266990(A1) |
申请公布日期 |
2008.10.30 |
申请号 |
US20070790934 |
申请日期 |
2007.04.30 |
申请人 |
INFINEON TECHNOLOGIES NORTH AMERICA CORP. |
发明人 |
LOEFFLER STEFFEN |
分类号 |
G11C7/00 |
主分类号 |
G11C7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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