发明名称 BAKE APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICES
摘要 A bake apparatus for manufacturing semiconductor devices is provided to prevent the pattern failure in a bake process by removing the step difference between the center part and the edge part of a wafer. A bake apparatus for manufacturing semiconductor devices includes a wafer in which a deposition process, an etching process, and a polishing process are performed; the hot plate(104) which the wafer is settled on, and is bent so that the center and edge portion of wafer is adhered closely; a heater installed at the lower part of hot plate(102) in order to maintain the same interval as center and edge portion of wafer. The heater is classified into 3 zones having the different heights. A guide(106) for guiding the seating position of wafer on the top of the hot plate is protruded.
申请公布号 KR20080095653(A) 申请公布日期 2008.10.29
申请号 KR20070040428 申请日期 2007.04.25
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUN, SUNG MIN
分类号 H01L21/20;H01L21/00 主分类号 H01L21/20
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