发明名称 ILLUMINATION SYSTEM FOR MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS COMPRISING AN ILLUMINATION SYSTEM OF THIS TYPE
摘要 <p>A microlithographic illumination system can include a light distribution device that can generate a two-dimensional intensity distribution in a first illumination plane. A first raster array of optical raster elements can generates a raster array of secondary light sources. A device with an additional optical effect can be disposed spatially adjacent to the two raster arrays. The device can be configured as an illumination angle variation device. The device can influence the intensity and/or the phase and/or the beam direction of the illumination light. The influence can be such that an intensity contribution of raster elements to the total illumination intensity can vary across the illumination field. This can enable the illumination intensity to be influenced across the illumination field in a defined manner with respect to the total illumination intensity and/or with respect to the intensity contributions from different directions of illumination.</p>
申请公布号 EP1984789(A1) 申请公布日期 2008.10.29
申请号 EP20070722838 申请日期 2007.02.16
申请人 CARL ZEISS SMT AG 发明人 DEGUENTHER, MARKUS;LAYH, MICHAEL;GERHARD, MICHAEL;THOME, BRUNO;SINGER, WOLFGANG
分类号 G03F7/20 主分类号 G03F7/20
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