发明名称 Method and program for selecting products to be inspected
摘要 <p>An inspection-required product selection method and program for minimizing the number of investigation steps at the time of occurrence of a defect of a product placed on the market are disclosed. A combination of product lots to be inspected is assumed based on the information on the material lots used for a product lot scheduled for production for a predetermined future period and the number of the product lots inspected during the same period. The number of the material lots not included in the product lots to be inspected is totalized for each product lot, and the statistical values are calculated for all the conceivable combinations of the product lots. The combination of the product lots optimizing the statistical values is selected for inspection.</p>
申请公布号 EP1986065(A2) 申请公布日期 2008.10.29
申请号 EP20080008055 申请日期 2008.04.25
申请人 HITACHI, LTD. 发明人 TANAKA, MASATAKA;KUMAZAWA, TAKAAKI;ICHINOHE, MASAYUKI
分类号 G05B23/02;G05B19/418;H01L21/66 主分类号 G05B23/02
代理机构 代理人
主权项
地址